Embedded Executives: Patrick Wadden, Global VP, Automotive Business Development, Vicor

April 15, 2020 Perry Cohen
 

Decentralized power is a phenomenon that’s starting to hit the automotive sector. Is it better to have lower power levels in more places in the car, as opposed to one centralized place? Hmm, I’m not sure, as I think I can make an argument for either solution. Rather than attempt a guess, I went right to an expert for this week’s Embedded Executives podcast. That expert is Patrick Wadden, Vicor's Global Vice President of Automotive Business Development. He explains which is the better approach and why.

About the Author

Perry Cohen

Perry Cohen, associate editor for Embedded Computing Design, is responsible for web content editing and creation in addition to podcast production. He also assists with the publication’s social media efforts which include strategic posting, follower engagement, and social media analysis. Before joining the ECD editorial team, Perry has been published on both local and national news platforms including KTAR.com (Phoenix), ArizonaSports.com (Phoenix), AZFamily.com, Cronkite News, and MLB/MiLB among others. Perry received a BA in Journalism from the Walter Cronkite School of Journalism and Mass Communications at Arizona State university. He can be reached by email at <a href="mailto:perry.cohen@opensysmedia.com">perry.cohen@opensysmedia.com</a>. Follow Perry’s work and ECD content on his twitter account @pcohen21.

Follow on Twitter Follow on Linkedin More Content by Perry Cohen
Previous Article
WAGO’s New Pro2 Power Supplies Maximizing System Uptime
WAGO’s New Pro2 Power Supplies Maximizing System Uptime

WAGO announced the release of the WAGO Pro2 Power Supplies. The new tech hosts six units from 120-960W with...

Next Article
dSPACE Offers A Solution For Developing and Testing New Technologies For Smart Charging
dSPACE Offers A Solution For Developing and Testing New Technologies For Smart Charging

The DS5366 Smart Charging Solution includes the integration of existing test systems and a test depth that ...