Swissbit Extends Range of SD Memory Card Series for Industrial Applications

August 25, 2020 Tiera Oliver

Swissbit has extended its range of industrial SD memory cards with new products: the S-50 and S-56 series. Based on industrial grade 3D NAND technology, the new products integrate flash chips with a controller and firmware, which is aimed at delivering high reliability within a robust housing. They are manufactured in Swissbit's own IATF 16949 certified fab.

The new S-5x range comprises the S-50 SD and S-50u micro SD memory cards, alongside the S-56 & S-56u versions which use 3D pSLC mode to achieve an increase in endurance. All support a full temperature range from -40°C to 85°C.

Other reliability features include 120b LDPC error correction (Low Density Parity Check Error Correcting Code), a full-page-fail protection mechanism, read disturb management, background data refresh, sudden power loss recovery, static and dynamic wear leveling, and, for mechanical protection, a molded SIP package with a 30µ" thick gold connector.

The firmware architecture supports suitable write bursts and, in combination with the other FW features, makes this series ideal for high read / write traffic that typically occurs in data logging, IPCs, HMI units, POS/POI, medical, and surveillance applications.

The S-50 SD memory card is initially available in capacities from 16GB to 256GB, while the S-50u range extends from 16GB to 128GB.

According to the company, where high endurance is required due to intense small block data logging or high traffic, then the S-56 & S-56u will deliver with its pSLC technology. The density range for these new cards is from 4GB to 64GB for the S-56, with 4GB to 32GB for the S-56u model.

Swissbit plans to add higher capacities for all variants later.

All memory cards across the new range are compliant to the SD 6.1 specification and support SPI mode. They reach up to UHS U3, speed class 10, and the A2 and VSC30 application classes.
The S-5x products are supported by the Swissbit Life Time Monitor that provides detailed usage information, allowing ideal prediction of the expected lifetime under real world applications.

For more information, visit:

About the Author

Tiera Oliver, edtorial intern for Embedded Computing Design, is responsible for web content edits as well as newsletter updates. She also assists in news content as far as constructing and editing stories. Before interning for ECD, Tiera had recently graduated from Northern Arizona University where she received her B.A. in journalism and political science and worked as a news reporter for the university's student led newspaper, The Lumberjack.

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