Waveform scanning techniques simplify embedded system designs

October 1, 2007 OpenSystems Media
Feature / Discussion: October 2007Recently developed measurement techniques are helping embedded system designers troubleshoot designs accurately and efficiently. These powerful techniques for characterizing and debugging designs contain microcontrollers, DSPs, FPGAs, A/D and D/A converters, and other devices that include address and data lines. Mike outlines several real-world engineering challenges and provides practical solutions illustrated by images captured live from actual embedded circuits using waveform scanning analysis. Designers can begin implementing these solutions immediately with real-time oscilloscope tools using the described techniques.

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Mike Hertz (LeCroy)
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