 | | The WriteNow! Series of In-System Programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration |
| The WriteNow! Series of In-System Programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration |
| XMC to PCI Express Adapter with metering function |
| Testing low- and medium-complexity wafers and IC modules at production-line speeds up to 1,000 tests/sec. |
| Thermal Monitoring System 2000 - for testing vehicle temperatures |
| Surface Mount Technology Corp. (SMT Corp.) located in Appleton, WI today announced the release of its proprietary SMART Test Platform. The SMART platform offers a test solution for low to mid volume PCB assemblies without high tooling costs. |
| Today at the ATCA Summit event in Santa Clara, the Communications Platforms Trade Association (CP-TA)introduced a self-testing program for the interoperability of xTCA (AdvancedTCA[ ](r), MicroTCA(r), AMC(r)) building blocks. Companies can now utilize the interoperability criteria, test procedures and test tools developed by CP-TA and its members to perform self-testing in order to verify xTCA product interoperability. CP-TA empowers the xTCA ecosystem by providing standardized, proven guidance and tools to lower integration costs without the added expense of a formal third party certification program. |
| LDRA and DDC-I have released a turnkey safety-critical software platform certifiable to DO-178B Level A, the FAA’s most demanding level. The integration will enable developers to quickly develop, debug and comprehensively test their applications, reducing development time and cost. |
| ASTER Technologies, the leading supplier in Board-Level Testability and Test Coverage analysis tools, and ITOCHU, the leading technology provider for flying probe test systems announced today the forming of a strategic partnership that enables ITOCHU to supply their TAKAYA flying probe tester customers with ASTER’s TPQR for TAKAYA, the test coverage analysis tool. |
| To meet the breech in software security, LDRA has tailored its tool suite to provide security-critical software development and certification. In addition to meeting CERT C secure coding standard, the LDRA tool suite now fully integrates MILS and new standards from Homeland Security. |
| Today’s technology often runs the gambit from low-level embedded control that services enterprise-level applications. To meet such needs, LDRA brings a raft of advanced features–multiprocessing optimization, superior version control, and an enhanced Eclipse plug-in. Such capabilities speed analysis and boost functionality for the highly iterative development found in mil&aero, telecom and medical markets. |
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