PikeTec presents test software at embedded world 2018

February 20, 2018 ECD Staff

PikeTec updates its test and verification software Time Partition Testing" (TPT) for C-code tests and now supports testing using Functional Mock-up Units.

On the Embedded World 2018, PikeTec presents its test software that enables the user to create and execute test cases for model-in-the-loop, software-in-the-loop, processor-in-the-loop, and hardware-in-the-loop independently from the test environment. A user-friendly design and the continuous development of interfaces to test environments are further characteristics of TPT.

A new feature is the analysis and the import of the C-code interface. TPT automatically generates the test environment for C-code. Using the GNU Debugger via Eclipse CDT, the C-code can be debugged during the test execution. TASMO for C automatically generates test data for an ideal code coverage of the C-code.

Users can now also run tests with Functional Mock-up Units (FMUs). "This increases the possibilities for setting up the test environment very much", Jens Lüdemann, CEO of PikeTec, says.

The dSPACE HiL connection via the XiL API is improved and fault injections are now possible.

The CANape connection is changed, so the user can now administer, measure, and also run diagnoses.

Processor-in-the-loop tests are also possible by using Lauterbach’s Trace32.

You can find PikeTec at booth 601 in hall 4.

The TPT testing tool can be used according to many safety standards and in all software development phases (MiL, SiL, PiL, HiL) in the field of embedded control and regulation systems. TPT can be connected to a lot of external test environments. Application areas: set up test cases, execute test cases, and evaluate test cases and measurement data.

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