1 through 4 of 4 articles found
PXI, Test and Technology
Integrating boundary scan with PXI and board-level ATE
By Heiko Ehrenberg (Goepel electronics LLC)
Summary:
Heiko Ehrenberg discusses extended boundary scan applications, and introduces the HySCAN concept, which has been developed to overcome many of the limitations encountered with the integration of JTAG/boundary scan tools with ATE.
Heiko Ehrenberg discusses extended boundary scan applications, and introduces the HySCAN concept, which has been developed to overcome many of the limitations encountered with the integration of JTAG/boundary scan tools with ATE.
Military Embedded Systems
Military sets sights on JTAG to meet test coverage challenges imposed by COTS design
By Dominic Plunkett (XJTAG)
Summary:
With increasing use of military-qualified, JTAG-compliant devices, JTAG test gear can be used to test military boards even more extensively as the number of such nets continues to rise.
With increasing use of military-qualified, JTAG-compliant devices, JTAG test gear can be used to test military boards even more extensively as the number of such nets continues to rise.
VMEbus Systems
Universal technology for the future
By Stefan Meissner (Goepel Electronic GmbH)
Summary:
This article discusses the advantages and resourcefulness of the Boundary Scan in testing.... (continues)
This article discusses the advantages and resourcefulness of the Boundary Scan in testing.... (continues)
PXI, Test and Technology
Combining boundary scan and CPU emulation for functional test and diagnosis
By Charles Swingler (ITT)
Summary:
This article discusses the advantages of boundary scan in manufacturing.
This article discusses the advantages of boundary scan in manufacturing.
